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IEICE Trans

Yue GUAN

Co-Design of Binary Processing in Memory ReRAM Array and DNN Model Optimization Algorithm
Yue GUAN Takashi OHSAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2020/11/01
Vol. E103-C  No. 11  pp. 685-692
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
neuromorphic ReRAM, binary neural network, fabrication fluctuation, 
 Summary | Full Text:PDF