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IEICE Trans

Youngkyu PARK

An Effective Programmable Memory BIST for Embedded Memory
Youngkyu PARK Jaeseok PARK Taewoo HAN Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/12/01
Vol. E92-D  No. 12  pp. 2508-2511
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
Programmable BIST, test algorithm, multi-loop, 
 Summary | Full Text:PDF