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IEICE Trans

Young-Bok JOO

Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System
Young-Bok JOO Chan-Ho HAN Kil-Houm PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6  pp. 922-928
Type of Manuscript:  PAPER
Category: Electronic Displays
Keyword: 
LCD automatic vision inspection (AVI), defect size, bell shape, volume based measuring method, 
 Summary | Full Text:PDF