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IEICE Trans

Yoshiro IWAI

i-MSE: A Fine Structure Imaging for Surface and Its Inside of Solid Material with Micro Slurry-Jet Erosion Test
Shinji FUKUMA Yoshiro IWAI Shin-ichiro MORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2023/11/01
Vol. E106-A  No. 11  pp. 1376-1384
Type of Manuscript:  Special Section PAPER (Special Section on Smart Multimedia & Communication Systems)
Category: Image
Keyword: 
imaging, fine structure, thin film coat, erosion, MSE test, 
 Summary | Full Text:PDF