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IEICE Trans

Yoshimitsu SAKAGAWA

Failure Rate Prediction Method for LSIs
Kiyoshi OGAWA Yoshimitsu SAKAGAWA Yoshio SUNOHARA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1983/09/25
Vol. E66-E  No. 9  pp. 550-556
Type of Manuscript:  PAPER
Category: Integrated Circuits
Keyword: 
 Summary | Full Text:PDF