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IEICE Trans

Yoshihiro NAGURA

An Embedded DRAM Hybrid Macro with Auto Signal Management and Enhanced-on-Chip Tester Naoya WATANABE Fukashi MORISHITA Yasuhiko TAITO Akira YAMAZAKI Tetsushi TANIZAKI Katsumi DOSAKA Yoshikazu MOROOKA Futoshi IGAUE Katsuya FURUE Yoshihiro NAGURA Tatsunori KOMOIKE Toshinori MORIHARA Atsushi HACHISUKA Kazutami ARIMOTO Hideyuki OZAKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/04/01 Vol. E86-C No. 4 pp. 624-634 Type of Manuscript: Special Section PAPER (Special Issue on High-Performance, Low-Power System LSIs and Related Technologies) Category: Design Methods and Implementation Keyword: embedded DRAM, various DRAM macros, low voltage operation, short TAT, BIST,
	Summary \| Full Text:PDF

Accomplishment of At-Speed BISR for Embedded DRAMs Yoshihiro NAGURA Yoshinori FUJIWARA Katsuya FURUE Ryuji OHMURA Tatsunori KOMOIKE Takenori OKITAKA Tetsushi TANIZAKI Katsumi DOSAKA Kazutami ARIMOTO Yukiyoshi KODA Tetsuo TADA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-D No. 10 pp. 1498-1505 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: BIST Keyword: at-speed test, BISR, embedded DRAM, test cost reduction,
	Summary \| Full Text:PDF