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IEICE Trans

Yoshiaki NEISHI

Two Dimensional Electric Field Measurement in Microstrip-Line Circuits by Coaxial-Type Probe
Takaharu HIRAOKA Yoshiaki NEISHI Tetsuo ANADA Jui-Pang HSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/01/01
Vol. E88-C  No. 1  pp. 77-82
Type of Manuscript:  Special Section PAPER (Special Section on Recent Trends of Microwave and Millimeter-Wave Passive Circuit Components and Technologies for Improvement of Characteristics)
Category: 
Keyword: 
microwave, FD-TD techniques, probe field mapping, coaxial probe, microstrip-line, measurement, 
 Summary | Full Text:PDF