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IEICE Trans

Yoichi IIZUKA

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor
Fukashi MORISHITA Wataru SAITO Norihito KATO Yoichi IIZUKA Masao ITO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2022/07/01
Vol. E105-C  No. 7  pp. 316-323
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
CMOS image sensor, column-parallel ADC, ramp generator, multi-functional fine pattern generator, IP test, 
 Summary | Full Text:PDF