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IEICE Trans

Yo TAKAHASHI

Simultaneous Switching Noise Analysis for High-Speed Interface
Narimasa TAKAHASHI Kenji KAGAWA Yutaka HONDA Yo TAKAHASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 460-467
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
SSN, power integrity, signal integrity, DDR, 
 Summary | Full Text:PDF