Simulation Study and SPICE Modeling of Single-Event Transients Induced by Secondary Ions Not Incident to the Drain in Nanoscale CMOS Technology Hao WUGuanghui SHIGang JINTengyue YIYiqi ZHUANG
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2015/06/01 Vol. E98-ANo. 6pp. 1234-1243 Type of Manuscript: PAPER Category: Digital Signal Processing Keyword: compressed sensing, signal recovery, orthogonal matching pursuit, greedy algorithm,