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IEICE Trans

Yin-He SU

Novel Techniques for Improving Testability Analysis
Yin-He SU Ching-Hwa CHENG Shih-Chieh CHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A  No. 12  pp. 2901-2912
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
testability, controllability, observability, TAIR, COP, 
 Summary | Full Text:PDF