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Yichun ZHOU

The Effect of Kr/O₂ Sputtering on the Ferroelectric Properties of SrBi₂Ta₂O₉ Thin Film Formation Binjian ZENG Jiajia LIAO Qiangxiang PENG Min LIAO Yichun ZHOU Shun-ichiro OHMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2019/06/01 Vol. E102-C No. 6 pp. 441-446 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: SBT thin film, Kr/O₂ sputtering, electrical properties, XRD,
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