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IEICE Trans

Yasuo NAKAGAWA

Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing Yuichi HAMAMURA Chizu MATSUMOTO Yoshiyuki TSUNODA Koji KAMODA Yoshio IWATA Kenji KANAMITSU Daisuke FUJIKI Fujihiko KOJIKA Hiromi FUJITA Yasuo NAKAGAWA Shun'ichi KANEKO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/01/01 Vol. E92-C No. 1 pp. 144-152 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: defects, failure analysis, yield estimation, integrated circuit layout, simulation,
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Solder Joint Inspection Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method Takashi HIROI Kazushi YOSHIMURA Takanori NINOMIYA Toshimitsu HAMADA Yasuo NAKAGAWA Shigeki MIO Kouichi KARASAKI Hideaki SASAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1993/10/25 Vol. E76-D No. 10 pp. 1144-1152 Type of Manuscript: Special Section PAPER (Special Section on Machine Vision Applications) Category: Keyword: inspection system, solder joint, speckle, defect detecion, fluorescence,
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Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection Takanori NINOMIYA Yasuo NAKAGAWA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1991/10/25 Vol. E74-D No. 10 pp. 3484-3491 Type of Manuscript: Special Section PAPER (Special Issue on Computer Vision and Its Applications) Category: Keyword:
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