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IEICE Trans

Yankang DU

Different Mechanisms of Temperature Dependency of N-Hit SET in Bulk and PD-SOI Technology
Biwei LIU Yankang DU Kai ZHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/05/01
Vol. E97-C  No. 5  pp. 455-459
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
N-hit SET, temperature dependency, carrier mobility, carrier lifetime, 
 Summary | Full Text:PDF