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IEICE Trans

Xue-Yan LIN

Analysis of Connector Contact Failure
Ji-Gao ZHANG Jin-Chun GAO Xue-Yan LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C  No. 6  pp. 945-952
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
Category: Devices
Keyword: 
dust contamination, corrosion products, contact failure, error codes, 
 Summary | Full Text:PDF