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IEICE Trans

Xiaoging WEN

Efficient Guided-Probe Fault Location Method for Sequential Circuits
Xiaoging WEN Kozo KINOSHITA Hideo TAMAMOTO Hiroshi YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/02/25
Vol. E78-D  No. 2  pp. 122-129
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
guided-probe fault location, selection of lines to probe, sequential circuit, VLSI diagnosis, 
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