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IEICE Trans

Wenpo ZHANG

Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D  No. 10  pp. 2719-2729
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defects, fault coverage, segmented scan, control point, observation point, 
 Summary | Full Text:PDF
Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/03/01
Vol. E97-D  No. 3  pp. 533-540
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defects, test compaction, test application time, test data volume, on-chip delay measurement, 
 Summary | Full Text:PDF
Improving Test Coverage by Measuring Path Delay Time Including Transmission Time of FF
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/05/01
Vol. E96-D  No. 5  pp. 1219-1222
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
small delay faults, test coverage, flip-flop, clock pulse, 
 Summary | Full Text:PDF