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IEICE Trans

Wen XIAOQING

Transistor Leakage Fault Diagnosis with IDDQ and Logic Information
Wen XIAOQING Hideo TAMAMOTO Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/04/25
Vol. E81-D  No. 4  pp. 372-381
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
fault diagnosis, transistor leakage fault, IDDQ testing, fault simulation, diagnostic vector generation, 
 Summary | Full Text:PDF