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IEICE Trans

Walter L. ENGL

Influence of Energy Transport Related Effects on NPN BJT Device Performance and ECL Gate Delay Analysed by 2D Parallel Mixed Level Device/Circuit Simulation
Matthias STECHER Bernd MEINERZHAGEN Ingo BORK Joachim M. J. KRÜCKEN Peter MAAS Walter L. ENGL 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 200-205
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Coupled Device & Circuit Modeling
Keyword: 
hydrodynamic model, velocity overshoot, circuit performance, 
 Summary | Full Text:PDF