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IEICE Trans

Tsutomu FUJII

Test-Retest Reliability and Criterion-Related Validity of the Implicit Association Test for Measuring Shyness
Tsutomu FUJII Takafumi SAWAUMI Atsushi AIKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/08/01
Vol. E96-A  No. 8  pp. 1768-1774
Type of Manuscript:  PAPER
Category: Human Communications
Keyword: 
implicit shyness, implicit association test, reliability, validity, 
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