Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1996/12/25
Vol. E79-C
No. 12
pp. 1699-1706
Type of Manuscript:
Special Section PAPER (Special Issue on Low-Power LSI Technologies) Category: Keyword: DRAM, power dissipation, reliability, bit-line, wordline, small swing, threshold voltage, sense amplifier, memory cell, |