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IEICE Trans

Tsu-Lin LI

An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs
Tsu-Lin LI Masaki HASHIZUME Shyue-Kung LU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 2026-2030
Type of Manuscript:  Special Section LETTER (Special Section on Dependable Computing)
Category: 
Keyword: 
NROM, data inversion, fault masking, yield, 
 Summary | Full Text:PDF