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IEICE Trans

Toshimi SHIMIZU

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs
Tokumi YOKOHIRA Toshimi SHIMIZU Hiroyuki MICHINISHI Yuji SUGIYAMA Takuji OKAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 874-881
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test, exhaustive testing, test pattern generation, minimum test set, dependence matrix, 
 Summary | Full Text:PDF