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IEICE Trans

Tomoyuki MORII

Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9  pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carrier, circuit reliability, simulation, BERT, 
 Summary | Full Text:PDF