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IEICE Trans

Tomoaki YOSHIZAWA

A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology
Masako FUJII Koji NII Hiroshi MAKINO Shigeki OHBAYASHI Motoshige IGARASHI Takeshi KAWAMURA Miho YOKOTA Nobuhiro TSUDA Tomoaki YOSHIZAWA Toshikazu TSUTSUI Naohiko TAKESHITA Naofumi MURATA Tomohiro TANAKA Takanari FUJIWARA Kyoko ASAHINA Masakazu OKADA Kazuo TOMITA Masahiko TAKEUCHI Shigehisa YAMAMOTO Hiromitsu SUGIMOTO Hirofumi SHINOHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1338-1347
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007))
Category: 
Keyword: 
large-scale integration, logic circuit fault diagnosis, SRAM, yield optimization, 
 Summary | Full Text:PDF