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IEICE Trans

Tokuya OSAWA

A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test
Masaru HARAGUCHI Tokuya OSAWA Akira YAMAZAKI Chikayoshi MORISHIMA Toshinori MORIHARA Yoshikazu MOROOKA Yoshihiro OKUNO Kazutami ARIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 453-459
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
DDR interface, SoC, round-trip-time, loop-backed test, 
 Summary | Full Text:PDF