Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/04/25 Vol. E81-CNo. 4pp. 528-536 Type of Manuscript: Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films) Category: Keyword: PZT, sol-gel, IrO2, Zr/Ti ratio, reliability,