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IEICE Trans

Tao KE

Reliable and Efficient Chip-PCB Hybrid PUF and Lightweight Key Generator
Yuanzhong XU Tao KE Wenjun CAO Yao FU Zhangqing HE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2023/08/01
Vol. E106-C  No. 8  pp. 432-441
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hybrid PUF, key generator, reliability self-test, debiasing algorithm, 
 Summary | Full Text:PDF