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IEICE Trans

Tamiyo NAKABAYASHI

Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation
Toshiki KANAMOTO Shigekiyo AKUTSU Tamiyo NAKABAYASHI Takahiro ICHINOMIYA Koutaro HACHIYA Atsushi KUROKAWA Hiroshi ISHIKAWA Sakae MUROMOTO Hiroyuki KOBAYASHI Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Vol. E89-A  No. 12  pp. 3666-3670
Type of Manuscript:  Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Interconnect
Keyword: 
interconnect, delay variation, parasitic capacitance, SoC, 
 Summary | Full Text:PDF