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IEICE Trans

Takeshi SAKAI

Low Leakage Current Nb-Based Tunnel Junctions with an Extra Top Al Layer
Mizuki IKEYA Takashi NOGUCHI Takafumi KOJIMA Takeshi SAKAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2017/03/01
Vol. E100-C  No. 3  pp. 291-297
Type of Manuscript:  Special Section PAPER (Special Section on Leading-Edge Technologies of Superconducting Measurement Systems)
Category: 
Keyword: 
SIS, junction, IV characteristic, sub-gap current, STEM, EDX, 
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