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IEICE Trans

Takehiro MABUCHI

Automatic Evaluation of the Appearance of Seam Puckers on Suits
Tsunehiro AIBARA Takehiro MABUCHI Masanori IZUMIDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/07/25
Vol. E83-D  No. 7  pp. 1346-1352
Type of Manuscript:  Special Section PAPER (Special Issue on Machine Vision Applications)
Category: 
Keyword: 
fractal dimension, seam puckers, pattern recognition, defect detection, wavelet transform, 
 Summary | Full Text:PDF