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IEICE Trans

Takako ISHIHARA


A SOI Multi-VDD Dual-Port SRAM Macro for Serial Access Applications
Nobutaro SHIBATA Mayumi WATANABE Takako ISHIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2017/11/01
Vol. E100-C  No. 11  pp. 1061-1068
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
10T memory cell, CMOS, dual-port SRAM, FIFO memory, fully depleted SOI, look-ahead operation, multi-VDD, serial access, 
 Summary | Full Text:PDF

A New High-Density 10T CMOS Gate-Array Base Cell for Two-Port SRAM Applications
Nobutaro SHIBATA Yoshinori GOTOH Takako ISHIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/06/01
Vol. E99-C  No. 6  pp. 717-726
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
10T type, bitline capacitance, CMOS, gate array, high speed, low power, memory-oriented base cell, shared contact, two-port SRAM, 
 Summary | Full Text:PDF

A SOI Cache-Tag Memory with Dual-Rail Wordline Scheme
Nobutaro SHIBATA Takako ISHIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2  pp. 316-330
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
4-way set-associative, cache-tag, CMOS, directed graph, dual-rail wordline, FD-SOI, I/O-separated memory cell, LRU, NRZ-type write-enable signal, SIMOX, SRAM, 
 Summary | Full Text:PDF

EB-Testing-Pad Method and its Evaluation by Actual Devices
Norio KUJI Takako ISHIHARA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1558-1563
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: EB Tester
Keyword: 
E-beam tester, observability, stacked vias, testing pads, multi level wiring, 
 Summary | Full Text:PDF