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IEICE Trans

Taisuke IWAKIRI

Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI Taisuke IWAKIRI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12  pp. 2666-2673
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defects, supply current test, CMOS circuits, electric field, 
 Summary | Full Text:PDF