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IEICE Trans

Taijiro OGAWA

Improved Forward Test Generation of Sequential Circuits Using Variable-Length Time Frames
Yuzo TAKAMATSU Taijiro OGAWA Hiroshi TAKAHASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7  pp. 832-836
Type of Manuscript:  Special Section LETTER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
forward test generation, sequential circuits, variable-length time frames, state escaping, 
 Summary | Full Text:PDF