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IEICE Trans

Sumiko OSHIDA

Minority Carrier Collection in 256 M-bit DRAM Cell on Incidence of Alpha-Particle Analyzed by Three-Dimensional Device Simulation
Sumiko OSHIDA Masao TAGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11  pp. 1604-1610
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: DRAM
Keyword: 
soft error, device simulation, 256 M-bit DRAM, 
 Summary | Full Text:PDF