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IEICE Trans

Stephen A. PARKE

Fault-Tolerant Designs for 256 Mb DRAM
Toshiaki KIRIHATA Yohji WATANABE Hing WONG John K. DEBROSSE Munehiro YOSHIDA Daisuke KATO Shuso FUJII Matthew R. WORDEMAN Peter POECHMUELLER Stephen A. PARKE Yoshiaki ASAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/07/25
Vol. E79-C  No. 7  pp. 969-977
Type of Manuscript:  Special Section PAPER (Special Issue on the 1995 Symposium on VLSI Circuits (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.31, No.4 April 1996))
Category: Memory
Keyword: 
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