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An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs
Tsu-Lin LI Masaki HASHIZUME Shyue-Kung LU | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D
No. 9
pp. 2026-2030
Type of Manuscript:
Special Section LETTER (Special Section on Dependable Computing)
Category:
Keyword:
NROM, data inversion, fault masking, yield, | | | Summary | Full Text:PDF | |
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Delay Fault Testing for CMOS Iterative Logic Arrays with a Constant Number of Patterns
Shyue-Kung LU | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D
No. 12
pp. 2659-2665
Type of Manuscript:
Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword:
delay fault, Iterative Logic Array, C-testable, bijection, | | | Summary | Full Text:PDF | |
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