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IEICE Trans

Shyh-Shyuan SHEU

A 50 ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit
Shyh-Shyuan SHEU Kuo-Hsing CHENG Yu-Sheng CHEN Pang-Shiu CHEN Ming-Jinn TSAI Yu-Lung LO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/06/01
Vol. E95-C  No. 6  pp. 1128-1131
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Resistive RAM (RRAM), verify, write resistance tracking circuit, 
 Summary | Full Text:PDF