IEICE Trans

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IEICE Trans

Shinji FUJII

Observation Techinique for Process-Induced Defects Using Anodic Oxidation Morio INOUE Shinji FUJII
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/03/25 Vol. E79-C No. 3 pp. 324-327 Type of Manuscript: Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology) Category: Particle/Defect Control and Analysis Keyword: delineation, defect, anodic oxidation, fabrication, failure analysis,
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Microstructure Analysis Technique of Specific Area by Transmission Electron Microscopy Yoshifumi HATA Ryuji ETOH Hiroshi YAMASHITA Shinji FUJII Yoshikazu HARADA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/04/25 Vol. E77-C No. 4 pp. 590-594 Type of Manuscript: Special Section PAPER (Special Issue on LSI Failure Analysis) Category: Keyword: TEM, FIB, specimen preparation, cross-sectional specimen,
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Automated Bias Control (ABC) Circuit for High-Performance VLSI's Tadahiro KURODA Toshiyuki FUKUNAGA Kenji MATSUO Kazuhiko KASAI Ayako HIRATA Shinji FUJII Masahiro KIMURA Hiroaki SUZUKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/04/25 Vol. E75-C No. 4 pp. 539-546 Type of Manuscript: Special Section PAPER (Joint Special Issue on the 1991 VLSI Circuits Symposium) Category: Keyword:
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