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IEICE Trans

Shingo INUYAMA

Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering
Masayuki ARAI Shingo INUYAMA Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2018/12/01
Vol. E101-A  No. 12  pp. 2262-2270
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
weighted fault coverage, critical area, critical area analysis, bridge fault, open fault, 
 Summary | Full Text:PDF