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IEICE Trans

ShaoChong LEI

A Single Input Change Test Pattern Generator for Sequential Circuits
Feng LIANG ShaoChong LEI ZhiBiao SHAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1365-1370
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
built-in self-test (BIST), single input change (SIC) sequence, seed, sequential circuit, 
 Summary | Full Text:PDF