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IEICE Trans

Seung Ho HONG

A CMOS Built-In Current Sensor for IDDQ Testing
Jeong Beom KIM Seung Ho HONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/06/01
Vol. E89-C  No. 6  pp. 868-870
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
IDDQ testing, current testing, BICS, reliability, 
 Summary | Full Text:PDF