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IEICE Trans

Seiji SEKI

Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
Kiyoshi FURUYA Seiji SEKI Edward J. McCLUSKEY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7  pp. 882-888
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
built-in self-test (BIST), two-pattern test, pseudorandom pattern generator, autonomous linear sequential circuit, transition coverage, 
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