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Seigen OTANI

Effect of Zr/Ti Ratio on the Reliability Characteristics Behavior of Sol-Gel Derived PZT Films on Pt/IrO₂ Electrode Katsuyoshi MATSUURA Kazuaki TAKAI Tetsuro TAMURA Hiroshi ASHIDA Seigen OTANI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/04/25 Vol. E81-C No. 4 pp. 528-536 Type of Manuscript: Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films) Category: Keyword: PZT, sol-gel, IrO₂, Zr/Ti ratio, reliability,
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