Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C
No. 5
pp. 835-841
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: AlN/GaN, HEMT, MOS-HEMT, Al2O3, wet etching, thermal oxidation, small-signal model, |