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IEICE Trans

Sang-Moon RYU

Transient Bit Error Recovery Scheme for ROM-Based Embedded Systems
Sang-Moon RYU Dong-Jo PARK 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9  pp. 2209-2212
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
transient bit error, memory scrubbing, reliability, embedded system, 
 Summary | Full Text:PDF