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IEICE Trans

Sang-Jae KIM

Electron-Beam-Damaged YBa2Cu3O7-y Josephson Junctions for High-Frequency Device Applications
Sang-Jae KIM Tsutomu YAMASHITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/10/25
Vol. E81-C  No. 10  pp. 1544-1548
Type of Manuscript:  Special Section PAPER (Special Issue on Low- and High-Temperature Superconductive Electron Devices and Their Applications)
Category: High-Tc Junction Technology
Keyword: 
YBa2Cu3O7-y, Si, focused electron beam irradiation, high-frequency device application, Josephson junction array, 
 Summary | Full Text:PDF