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IEICE Trans

Sang Seol LEE

An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem
Sang Seol LEE Kyu Ho PARK 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7  pp. 771-775
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
fault simulation, reconvergent fan-out stem, combinational circuit, primary stem region, exit line, 
 Summary | Full Text:PDF