Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/12/01 Vol. E93-ANo. 12pp. 2481-2489 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verification Keyword: scan-based side-channel attack, scan path, testability, cryptosystem, RSA, security,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/12/01 Vol. E92-ANo. 12pp. 3229-3237 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Embedded, Real-Time and Reconfigurable Systems Keyword: scan-based attack, side-channel attack, scan chain, testability, security, cryptography, AES,