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IEICE Trans

Ryuji OHBA

Power Consumption of Hybrid Circuits of Single-Electron Transistors and Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
Ken UCHIDA Junji KOGA Ryuji OHBA Akira TORIUMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8  pp. 1066-1070
Type of Manuscript:  Special Section PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
single-electron, tunneling, MOSFET, power, 
 Summary | Full Text:PDF